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Near Ir Scanning Angle Total Internal Reflection Raman Spectroscopy At Smooth Gold Films, Kristopher J. Mckee, Matthew W. Meyer, Emily A. Smith Apr 2012

Near Ir Scanning Angle Total Internal Reflection Raman Spectroscopy At Smooth Gold Films, Kristopher J. Mckee, Matthew W. Meyer, Emily A. Smith

Chemistry Publications

Total internal reflection (TIR) Raman and reflectivity spectra were collected for nonresonant analytes as a function of incident angle at sapphire or sapphire/smooth 50 nm gold interfaces using 785 nm excitation. For both interfaces, the Raman signal as a function of incident angle is well-modeled by the calculated interfacial mean square electric field (MSEF) relative to the incident field times the thickness of the layer being probed in the Raman measurement (DRS). The Raman scatter was reproducibly enhanced at the interface containing a gold film relative to the sapphire interface by a factor of 4.3−4.6 for ...


Development Of A Scanning Angle Total Internal Reflection Raman Spectrometer, Kristopher J. Mckee, Emily A. Smith Apr 2010

Development Of A Scanning Angle Total Internal Reflection Raman Spectrometer, Kristopher J. Mckee, Emily A. Smith

Chemistry Publications

A scanning angle total internal reflection (SATIR) Raman spectrometer has been developed for measuring interfacial phenomena with chemical specificity and high axial resolution perpendicular to the interface. The instrument platform is an inverted optical microscope with added automated variable angle optics to control the angle of an incident laser on a prism/sample interface. These optics include two motorized translation stages, the first containing a focusing lens and the second a variable angle galvanometer mirror. The movement of all instrument components is coordinated to ensure that the same sample location and area are probed at each angle. At angles greater ...